Scanning electron microscopes (SEMs) are versatile instruments and they can do much more than you would expect. An SEM can provide key information such as structure, morphology and elemental composition about the surface or near-surface region of a sample. For this reason, it has become the tool of choice for several fields from material science to forensics, battery and additive manufacturing and more. Desktop SEMs have now been personalised enabling faster, easier to use, on-site SEM imaging and analysis. Good sample preparation is a critical step when a high-quality SEM image is needed. Some samples can be quite challenging to image particularly if they are non-conducting. This guide will provide users with a few helpful tips and tricks when preparing samples for imaging. Meant for those who are approaching scanning electron microscopy for the first
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